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Using an EM-CCD camera, it is possible to sensitively capture images of the EL emission state of PV cells and modules.
Using a 1 million pixel high-sensitivity EM-CCD, it is possible to detect microcracks, chipping, back-side burn-in, defects, and dirt generated during the process. EM-CCD cameras have lower noise compared to cooled CCD cameras and can achieve shorter shutter speeds, making them suitable for integration into inline devices.
It is possible to sensitively capture images of the EL emission state of PV cells and modules!
The 『DKELT-1320E』 is a micro-crack inspection device for crystalline solar cell modules. Using a 1-megapixel high-sensitivity EM-CO, it can detect micro-cracks, chipping, back-side burning, defects, and dirt generated during the process, making it easy to save and reference images and defect location data. The EM-CCD camera can be integrated into inline devices because it has lower noise and shorter shutter speeds compared to cooled CCD cameras. 【Features】 ■ Assists in judgment with colored display of defect locations ■ Displays the entire module on a 32-inch large screen ■ Easy to save and reference images and defect location data ■ Capable of sensitively capturing images in EL emission state ■ Fully automatic work transport and pitch conversion of the work transport section *For more details, please refer to the catalog or feel free to contact us.
